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Routine Maintenance Procedures
555-233-123
5-60
Issue 4 May 2002
The second part of the test sends the standard DS1 3-in-24 stress testing pattern
from the DS1 board, through the loopback jack, and back to a bit error detector
and counter on the DS1 board. The bit error rate counter may be examined at will
via the management terminal, and provides the results of the second part of the
test. The test remains in this state until it is terminated so that the CPE wiring may
be bit error rate tested for as long as desired.
1. Busy out the DS1 circuit pack by entering busyout board UUCCSS
(where UUCCSS is the cabinet, carrier, and slot number of the DS1 board).
2. At the management terminal, enter change ds1 <location> and verify the
near-end csu type
is set to
integrated
.
3. Change to page 2 of the DS1 administration form and confirm that the TX
LBO field is 0dB. If not, record the current value and change it to 0dB for
testing. Press
Enter
to implement the changes or press
Cancel
to change
nothing.
4. Enter test ds1-loop <location> cpe-loopback-jack. This turns on simplex
power to the loopback jack and waits about 20 seconds for any active DS1
facility alarms to clear. A “PASS” or “FAIL” displays on the terminal. This is
the first of the 2 results. A “FAIL” indicates a fault is present in the wiring
between the ICSU and the loopback jack. The loopback jack may also be
faulty. A “PASS” only indicates that the loopback jack looped successfully,
not that the test data contains no errors. If a “PASS” is obtained, continue
with the following steps.
NOTE:
The loss of signal (LOS) alarm (demand test #138) is not processed
during this test while the 3-in-24 pattern is active.
5. Enter clear meas ds1 loop <location> to clear the bit error count.
6. Enter clear meas ds1 log <location> to clear the performance
measurement counts.
7. Enter clear meas ds1 esf <location> to clear the ESF error count.
8. Enter list meas ds1 sum <location> to display the bit error count. Refer to
for troubleshooting information.
Содержание Definity SI
Страница 1: ...0DLQWHQDQFH IRU YD D 1 7 6HUYHU 6 Volumes 1 2 and 3 555 233 123 Issue 4 May 2002...
Страница 62: ...Maintenance Architecture 555 233 123 1 26 Issue 4 May 2002...
Страница 92: ...Management Terminals 555 233 123 3 26 Issue 4 May 2002...
Страница 204: ...Routine Maintenance Procedures 555 233 123 5 100 Issue 4 May 2002...
Страница 250: ...LED Interpretation 555 233 123 7 10 Issue 4 May 2002...
Страница 2763: ...VC DSPPT Issue 4 May 2002 10 1977 555 233 123 Figure 10 107 VC Circuit Pack DSP Port Local TDM Loopback Test...
Страница 2776: ...Maintenance Object Repair Procedures 555 233 123 10 1990 Issue 4 May 2002 Figure 10 109 VC Circuit Pack Summer Port Loopback Test...
Страница 2804: ...Maintenance Object Repair Procedures 555 233 123 10 2018 Issue 4 May 2002...
Страница 2968: ...Index 555 233 123 IN 10 Issue 4 May 2002...