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DS1-BD (DS1 Interface Circuit Pack)
Issue 4 May 2002
10-689
555-233-123
End Loopback/Span Test (#1216)
This test is destructive.
The End Loopback/Span Test will terminate an active loopback or span test on a
TN767E DS1 circuit pack. Bit error counting against the received test pattern
stream is terminated and sending of the framed 3-in-24 test pattern is halted. If
either the CPE Loopback Jack or the far-end CSU is looped, the appropriate
loopback deactivate code is sent. If the loopback could not be deactivated, then
the test will FAIL and a MINOR alarm will be noted in the alarm log until the
loopback is cleared.
The test is highly destructive and can only be initiated by a system technician
demanded test ds1-loop UUCSS end-loopback/span-test command. Since only
one of these three different long-duration loopback/span tests can be active at a
time, the TN767E circuit pack knows which loopback/span test to terminate.
All trunks or ports on the DS1 Interface circuit pack must be busied out via the
system technician busyout board command before running this End
Loopback/Span Test.
0
NO
BOARD
The test could not relate the internal ID to the port (no board).
This could be due to incorrect translations, no board is inserted,
an incorrect board is inserted, or an insane board is inserted.
1. Check to ensure that the board translations are correct. Use
the add ds1 UUCSS command to administer the DS1
interface if it is not already administered.
2. If board was already administered correctly, check the error
log to determine if the board is hyperactive. If this is the
case, the board is shut down. Reseating the board will
re-initialize the board.
3. If the board was found to be correctly inserted in step 1,
issue the busyout board command.
4. Issue the reset board command.
5. Issue the release busy board command.
6. Issue the test board long command.
This should re-establish the link between the internal ID and the
port.
Table 10-250.
TEST #1215 Inject Single Bit Error Test — Continued
Error
Code
Test
Result
Description/Recommendation
Continued on next page
Содержание Definity SI
Страница 1: ...0DLQWHQDQFH IRU YD D 1 7 6HUYHU 6 Volumes 1 2 and 3 555 233 123 Issue 4 May 2002...
Страница 62: ...Maintenance Architecture 555 233 123 1 26 Issue 4 May 2002...
Страница 92: ...Management Terminals 555 233 123 3 26 Issue 4 May 2002...
Страница 204: ...Routine Maintenance Procedures 555 233 123 5 100 Issue 4 May 2002...
Страница 250: ...LED Interpretation 555 233 123 7 10 Issue 4 May 2002...
Страница 2763: ...VC DSPPT Issue 4 May 2002 10 1977 555 233 123 Figure 10 107 VC Circuit Pack DSP Port Local TDM Loopback Test...
Страница 2776: ...Maintenance Object Repair Procedures 555 233 123 10 1990 Issue 4 May 2002 Figure 10 109 VC Circuit Pack Summer Port Loopback Test...
Страница 2804: ...Maintenance Object Repair Procedures 555 233 123 10 2018 Issue 4 May 2002...
Страница 2968: ...Index 555 233 123 IN 10 Issue 4 May 2002...