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test environment
Issue 4 May 2002
8-437
555-233-123
Feature Interactions
The long test recycles power in some specified cabinet on non-SPE and
maintenance board carriers and is destructive. Specifically, the “a” carrier of PPNs
and EPNs does not have power recycled. In PPNs containing duplicated SPEs
the “b” carrier also does not have power recycled. All port carriers are recycled,
and service is interrupted for each port carrier. If a carrier containing an active EI
is recycled, communication with that cabinet is disrupted. If a carrier containing an
active tone-clock board is recycled, all ports in the cabinet or port network are
service disrupted.
Action/Object
Qualifier Qualifier Description
Logins
Defaults
Feature
Interactions
test environment location
short
long
repeat
number
clear
schedule
Cabinet (1-3); 1 = PPN, 2-3 =
optional EPN.
Option for a brief series of
nondestructive diagnostic tests.
Option for a longer, more
comprehensive series of both
destructive and nondestructive
diagnostic tests.
How many times each test in the
sequence is repeated (1-100)
This option causes the test sequence
(short or long) to repeat until the
alarm (if any) is cleared or a single
test in the sequence fails.
1
Command is validated and then a
scheduling form displays to schedule
execution of the command. The
command is then placed in the
command queue and is executed at
the specified time. The information
displayed by the command is sent to
the system printer instead of the
screen.
2
Examples:
test environment
test environment schedule
test environment 1 sh
test environment 1 l r 25
test environment 01 l r 25
test environment 01 l r 25
schedule
test environment 2 l c
test environment 3 c
1
If no alarms are registered against the maintenance object then the test sequence is run only once. The long clear
option forces a clear of all alarms if no errors are encountered during testing. The short clear option only clears
alarms pertinent to tests in the short sequence.
2
Refer to the Report Scheduler and System Printer feature specification for more details.
init
inads
craft
Cabinet = 1;
test sequence =
short; repeat = 1
See below
Содержание Definity SI
Страница 1: ...0DLQWHQDQFH IRU YD D 1 7 6HUYHU 6 Volumes 1 2 and 3 555 233 123 Issue 4 May 2002...
Страница 62: ...Maintenance Architecture 555 233 123 1 26 Issue 4 May 2002...
Страница 92: ...Management Terminals 555 233 123 3 26 Issue 4 May 2002...
Страница 204: ...Routine Maintenance Procedures 555 233 123 5 100 Issue 4 May 2002...
Страница 250: ...LED Interpretation 555 233 123 7 10 Issue 4 May 2002...
Страница 2763: ...VC DSPPT Issue 4 May 2002 10 1977 555 233 123 Figure 10 107 VC Circuit Pack DSP Port Local TDM Loopback Test...
Страница 2776: ...Maintenance Object Repair Procedures 555 233 123 10 1990 Issue 4 May 2002 Figure 10 109 VC Circuit Pack Summer Port Loopback Test...
Страница 2804: ...Maintenance Object Repair Procedures 555 233 123 10 2018 Issue 4 May 2002...
Страница 2968: ...Index 555 233 123 IN 10 Issue 4 May 2002...