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System Technician Commands for High and Critical
Reliability Systems
Issue 4 May 2002
6-15
555-233-123
System Technician Commands for
High and Critical Reliability Systems
The following system technician commands support high and critical reliability
systems. Complete descriptions of these commands are found in
‘‘Maintenance Commands and Trouble-Clearing Aids’’
Commands for SPE Duplication
■
The busyout SPE-standby command stops all background maintenance
activities on the Standby SPE, and it doubles memory shadowing.
■
The release SPE-standby command refreshes the Standby SPE, and it
allows all background standby maintenance activities to continue.
■
The status system command displays the status of the Active SPE and
the Standby SPE (among other information).
NOTE:
Verify that the Standby SPE is functional (no duplication alarms exist
and the SPE has returned to the Standby Mode) by running the
status system 1 command. If the standby SPE is in the maint/idle
mode with no standby alarms, use the standby refresh command to
put the standby SPE into the standby mode. Verify the results by
using the status system 1 command. For more information about the
status system command see
Chapter 8, ‘‘Maintenance Commands
■
The status mem-card [1] a|b command displays the status of the Active
SPE Memory Card or the status of the Standby SPE Memory Card.
■
The test processor [1] a | b [short | long] command tests the specified
Processor circuit pack.
■
The test memory [1] a | b [short | long] command tests the specified
on-circuit pack memory with an optional Memory Expansion circuit pack.
■
The test card-mem [1] a | b [short | long] command tests either the
Active SPE Memory Card or the Standby SPE Memory Card.
■
The test network-control [1] a | b [short | long] command tests the
specified TN777B Network Control circuit pack and the Memory Card.
■
The test packet-control [1] a | b [short | long] command tests the
specified TN778 Packet Control circuit pack.
■
The test interface [1] a1 | b1 [short | long] command tests the specified
first TN765 Processor Interface circuit pack.
■
The test interface [1] a2 | b2 [short | long] command tests the specified
second TN765 Processor Interface circuit pack.
Содержание Definity SI
Страница 1: ...0DLQWHQDQFH IRU YD D 1 7 6HUYHU 6 Volumes 1 2 and 3 555 233 123 Issue 4 May 2002...
Страница 62: ...Maintenance Architecture 555 233 123 1 26 Issue 4 May 2002...
Страница 92: ...Management Terminals 555 233 123 3 26 Issue 4 May 2002...
Страница 204: ...Routine Maintenance Procedures 555 233 123 5 100 Issue 4 May 2002...
Страница 250: ...LED Interpretation 555 233 123 7 10 Issue 4 May 2002...
Страница 2763: ...VC DSPPT Issue 4 May 2002 10 1977 555 233 123 Figure 10 107 VC Circuit Pack DSP Port Local TDM Loopback Test...
Страница 2776: ...Maintenance Object Repair Procedures 555 233 123 10 1990 Issue 4 May 2002 Figure 10 109 VC Circuit Pack Summer Port Loopback Test...
Страница 2804: ...Maintenance Object Repair Procedures 555 233 123 10 2018 Issue 4 May 2002...
Страница 2968: ...Index 555 233 123 IN 10 Issue 4 May 2002...