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DS1-BD (DS1 Interface Circuit Pack)
Issue 4 May 2002
10-679
555-233-123
Far CSU Loopback Test (#1213)
This test is destructive.
The Far CSU Loopback (R-LLB) Test causes a loopback at the far-end CSU and
tests all circuitry and facilities from the local TN767E DS1 board to the far-end
CSU.
The test is destructive and can only be initiated by a system technician demanded
test ds1-loop UUCSS far-csu-loopback-test-begin command.
All trunks or ports on the DS1 Interface circuit pack must be busied out via the
system technician busyout board command before running the Far CSU
Loopback Test.
If the far-end CSU is not a 120A CSU Module or a 401A T1 Sync Splitter, and the
DS1 is administered for ami-zcs line coding, one’s density protection must be
disabled on the CSU during the test due to the large number of zero’s in the
3-in-24 test pattern.
The Far CSU Loopback Test has the TN767E DS1 Interface circuit pack transmit
a loopback activation code to the remote CSU, waits up to 15 seconds for return
of the code to verify the loopback has been established, transmits a framed
3-in-24 test pattern, begins counting bit errors in the received test pattern, and
returns a PASS result. If the loopback is not established within the 15 seconds,
the test fails.
The status of the Far CSU Loopback test will be available in the hardware error
log via error type 3901. Several distinct aux values will be used to give the user
information of the status of the test.
The list measurements ds1 summary command will display the length of time the
test has been running (Test Duration field) and number of bit errors detected
(Loopback/Span Test Bit-Error Count field). If the test pattern is being passed
through the loopback cleanly, the number of bit errors should be very low. The
command will also display the type of loopback/span test executing (Test field),
the type of pattern generated for the loopback/span test (Pattern field), and
whether the pattern (i.e. 3-in-24 Pattern) is synchronized (Synchronized field).
To terminate the test, enter test ds1-loop UUCSS end-loopback/span-test or
the release board command. Using the release board command will restore all
trunks or ports on the TN767E DS1 Interface circuit pack to the in-service state.
Содержание Definity SI
Страница 1: ...0DLQWHQDQFH IRU YD D 1 7 6HUYHU 6 Volumes 1 2 and 3 555 233 123 Issue 4 May 2002...
Страница 62: ...Maintenance Architecture 555 233 123 1 26 Issue 4 May 2002...
Страница 92: ...Management Terminals 555 233 123 3 26 Issue 4 May 2002...
Страница 204: ...Routine Maintenance Procedures 555 233 123 5 100 Issue 4 May 2002...
Страница 250: ...LED Interpretation 555 233 123 7 10 Issue 4 May 2002...
Страница 2763: ...VC DSPPT Issue 4 May 2002 10 1977 555 233 123 Figure 10 107 VC Circuit Pack DSP Port Local TDM Loopback Test...
Страница 2776: ...Maintenance Object Repair Procedures 555 233 123 10 1990 Issue 4 May 2002 Figure 10 109 VC Circuit Pack Summer Port Loopback Test...
Страница 2804: ...Maintenance Object Repair Procedures 555 233 123 10 2018 Issue 4 May 2002...
Страница 2968: ...Index 555 233 123 IN 10 Issue 4 May 2002...