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Maintenance Object Repair Procedures
555-233-123 10-1534 Issue 4 May 2002
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test network-control [[0]1] a|b [short | long]
Runs the same set of tests on the standby SPE as on the Active SPE.
Refer to the SW-CTL, DATA-BD, DATA-CHL, and CARD-MEM sections for
a complete list of the tests that are run.
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test card-mem [[0]1] a|b [short | long]
Runs the same set of tests on the standby SPE as on the Active SPE.
Refer to the CARD-MEM section for a complete list of the tests that are run.
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test packet-control [[0]1] a|b [short | long]
For test packet-control, the most significant difference between testing
the Active Packet Control versus the Standby Packet Control is that the
Reset Test (#586) runs on the Standby SPE Packet Control circuit pack.
Also, the short and long options cause the identical set of tests to run.
Refer to the PKT-CTRL section for a complete list of the tests that are run.
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test interface [[0]1] a1 | a2 | b1 | b2 [short | long]
For this command, there is a single test for the Standby SPE Processor
Interface circuit pack(s) and a single test for each Processor Interface Port
on a Processor Interface circuit pack. These tests are different from the
tests that are run for the corresponding Active SPE Processor Interface
circuit pack(s) and Processor Interface Port(s). Refer to the PI-PT section
for a complete list of the tests that are run.
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test duplication-interface [0[1] a|b [short | long]
Runs the same set of tests on the standby SPE as on the Active SPE.
Refer to the DUPINT section for a complete list of the tests that are run.
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test spe-standby [short | long]
The test spe-standby [short | long] command results in the execution of
all tests that would be run if each of the previous commands in this list was
executed individually. Because of the number of tests that it runs, test
spe-standby [short | long] takes from 10 to 30 minutes to complete.
The Short and Long Test Sequences for test spe-standby are listed on the
following pages. Refer to the appropriate maintenance section for a
complete description of each of the tests.