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Maintenance Object Repair Procedures
555-233-123
10-1538
Issue 4 May 2002
4. The test spe-standby long command is also an exception to the first item.
The first test in the sequence is, the Memory Functional Test (#332), takes
from 30 seconds to two minutes to run. After the Memory Functional Test
(#332) is run, the next test in the sequence, the Shadow Link Test (#318),
takes from one to five minutes to run. After the Shadow Link Test (#318) is
run, the next test in the sequence, the MBUS Time-out Query (#285), takes
from 30 seconds to two minutes to run. After the MBUS Time-out Query
(#285) is run, the same delays described in Item 1 of this list are relevant.
5. If one of listed test commands is executed so that the Active SPE puts the
Standby SPE into Maintenance Mode, the Active SPE leaves the Standby
SPE in Maintenance Mode for three minutes after the completion of the
command. If an additional test command (with the exception of those
described in Items 6, 7, and 8) is executed within three minutes, the one to
20-minute delay prior to the first test will not be observed. Each test in the
sequence, including the first test, takes from 10 to 60 seconds to run.
Furthermore, the Active SPE leaves the Standby SPE in Maintenance
Mode for three minutes after the completion of the additional command.
This is true for each additional test command issued on a Standby SPE
component.
6. The test memory [[0]1] a | b long command is an exception to Item 5.
Because of the nature of the Memory Functional Test (#332) the same
delays as described in Item 2 are always observed for test memory [[0]1]
a | b long.
7. The test duplication-interface [[0]1] a | b long command is also an
exception to Item 5. Because of the nature of the MBUS Time-out Query
(#285) the same delays as described in Item 3 are always observed for
test duplication-interface [[0]1] a | b long.
8. The test spe-standby long command is also an exception to Item 5.
Because of the nature of the Memory Functional Test (#285), the Shadow
Link Test (#318), and the MBUS Time-out Query (#285) the same delays
as described in Item 4 are always observed for test spe-standby long.
9. For test commands whose sequence spans multiple terminal screens (for
example, test spe-standby [short | long]) the same 3-minute window that
was described in Item 4 applies to pressing the “page” key to proceed to
the next screen of test results. If the “page” key is not pressed within three
minutes of the completion of the last test on the current screen, the one to
20 minute delay is observed before the first test on the next screen is run
and its test results are displayed on the terminal. Each subsequent test on
that screen takes from 10 to 60 seconds to run. If the “page” key is pressed
within three minutes of the completion of the last test on the current screen,
the one to 20 minute delay will not be observed.
Содержание Definity SI
Страница 1: ...0DLQWHQDQFH IRU YD D 1 7 6HUYHU 6 Volumes 1 2 and 3 555 233 123 Issue 4 May 2002...
Страница 62: ...Maintenance Architecture 555 233 123 1 26 Issue 4 May 2002...
Страница 92: ...Management Terminals 555 233 123 3 26 Issue 4 May 2002...
Страница 204: ...Routine Maintenance Procedures 555 233 123 5 100 Issue 4 May 2002...
Страница 250: ...LED Interpretation 555 233 123 7 10 Issue 4 May 2002...
Страница 2763: ...VC DSPPT Issue 4 May 2002 10 1977 555 233 123 Figure 10 107 VC Circuit Pack DSP Port Local TDM Loopback Test...
Страница 2776: ...Maintenance Object Repair Procedures 555 233 123 10 1990 Issue 4 May 2002 Figure 10 109 VC Circuit Pack Summer Port Loopback Test...
Страница 2804: ...Maintenance Object Repair Procedures 555 233 123 10 2018 Issue 4 May 2002...
Страница 2968: ...Index 555 233 123 IN 10 Issue 4 May 2002...