Avaya Definity SI, Maintenance Manual, Page: 733 / 2968

test spe-standby
Issue 4 May 2002 8-483 555-233-123
test spe-standby
This command allows the technician to perform hardware diagnostic tests on the
standby Switch Processing Element (SPE) in a duplex SPE system. This
command tests all MOs in the standby MO. The STBY-SPE MO itself does not
have any defined tests. Instead, tests are run on the following MOs when the test
spe-standby command is run.
Refer to these MOs for more details. This command is only for a High or Critical
Reliability systems.
Feature Interactions
Testing the standby SPE maintenance object makes the standby SPE unavailable
to take over for the active SPE.
MEMORY DUPINT PROCR FL-DATA
SHDW-LNK DATA-BD PR-MAINT PI-BD
SHDW-CIR DATA-CHL PI-PT SPE_SELEC
SW-CTL CARD-MEM PKT-CTRL
Action/
Object
Qualifiers Qualifier Description Logins Defaults
Feature
Interactions
test
spe-standby short
long
repeat
number
clear
Option for a brief series of
nondestructive diagnostic tests.
Option for a longer, more
comprehensive series of both
destructive and nondestructive
diagnostic tests.
How many times each test in the
sequence is repeated (1-100)
This option causes the test
sequence (short or long) to
repeat until the alarm (if any) is
cleared or a single test in the
sequence fails.
1
Examples:
test spe-standby long
test spe-standby l
test spe-standby s r 2
test spe-standby c
1 If no alarms are registered against the maintenance object then the test sequence is run only once. The long
clear option forces a clear of all alarms if no errors are encountered during testing. The short clear option only
clears alarms pertinent to tests in the short sequence.
init
inads
craft Test
Sequence
= short;
Repeat = 1 See below