Avaya Definity SI, Maintenance Manual, Page: 1494 / 2968

Maintenance Object Repair Procedures
555-233-123 10-708 Issue 4 May 2002
Notes:
a. When running the Long Test Sequence on Duplication Interface circuit
pack A, the results of Test #273 may overwrite the results of Test #274.
b. Refer to SHDW-CIR (Common Shadow Circuit) for a description of this
test.
c. Refer to SPE-SELEC (SPE Select Switch) for a description of this test.
Table 10-260. System Technician-Demanded Tests: DUPINT
Order of Investigation Short Test Sequence Long Test Sequence D/ND
1
1 D = Destructive, ND = Non-destructive
Active Standby Active Standby
Duplication Interface Circuit Pack Status
Query Test (#315) X X X X ND
Duplication Interface Circuit Pack Sanity
Maze Test (#277) X X X X ND
Duplication Interface Circuit Pack SPE A
Loop Back Test (#275) X X X X ND
Duplication Interface Circuit Pack SPE B
Loop Back Test (#276) X X X X ND
Duplication Interface Circuit Pack
Administration Terminal Loop Back Test
(#274)(a) X X X X ND
Inter-Duplication Interface Circuit Pack
Loop Back Test (#280) X X X X ND
Duplication Interface Circuit Pack
Background Test Query Test (#271) X X X X ND
Duplication Interface Circuit Pack Invalid
Message Query Test (#272) X X X X ND
Common Shadow Circuit Fiber Cable
Present Test (#1289) (b) X X X X ND
Common Shadow Circuit M-BUS
Time-out Query Test (#285) (b) X X ND
Common Shadow Circuit Loop Back Test
(#283) (b) X X ND
Common Shadow Circuit Address
Decoder Test (#284) (b) X X ND
SPE Select Switch Query Test (#278) (c) X X X X ND
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