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test memory
Issue 5 October 2002
569
555-233-119
test memory
Use test memory to run hardware diagnostic tests on any or all memory circuit
packs in the specified carrier. Both short and the long test are nondestructive
when testing memory.
Action/
Object
Qualifier Qualifier Description Logins Defaults
Feature
Interactions
test
memory location
short
long
repeat
number
clear
schedule
Physical location of the memory circuit
pack: PC (cabinet number (optional) and
carrier letter (a).
Option for a brief series of nondestructive
diagnostic tests.
Option for a longer, more comprehensive
test series (all nondestructive for this
command).
Number of times each test in the
sequence is repeated (1-100)
This option causes the test sequence
(short or long) to repeat until the alarm (if
any) is cleared or a single test in the
sequence fails.
1
Use the screen to schedule execution of
the command. The command is placed in
the command queue and is executed at
the specified time. The information
displayed by the command is sent to the
system printer instead of the screen.
2
Examples:
test memory
test memory a
test memory a schedule
test memory 1a2
test memory b1 sh
test memory b l r 25
test memory a l c
1 If no alarms are registered against the maintenance object then the test sequence is run only once. The long
clear option forces a clear of all alarms if no errors are encountered during testing. The short clear option only
clears alarms pertinent to tests in the short sequence.
2 See the Report Scheduler and System Printer feature specification for more details.
init
inads
craft
nms cabinet = 1
For SPE
simplex
systems,
carrier =a.
Remaining
defaults are
short with a
repeat of 1.
none