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SDTI Module
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Test patterns are exported in chunks that are sized to the internal serial interface data bus. For example, if
the serial interface is configured as 4-wire, test patterns are exported in a multiple of four patterns. For
2-wire interface, patterns are exported in a multiple of 8 patterns; for 1-wire interface, patterns are
exported in a multiple of 16 patterns.
27.3.4.5.1 Simple Patterns
Simple A and F patterns can be used for calibration, observing cross-talk, and ground bounce.
These patterns depend on the interface width selected.
summarizes the patterns generated.
Table 27-36. Simple Test Pattern
Interface Width (Bits)
Pattern A
Pattern F
1
0, 1
0, 1
2
01, 10
00, 11
4
0x5, 0xA
0x0, 0xF
27.3.4.5.2 Walking Ones
The walking-ones pattern can be used to verify connectivity and correct bits that are being driven.
This pattern depends on the interface width selected.
lists the patterns generated.
Table 27-37. Walking Test Pattern
Interface Width (Bits)
Pattern
1
0, 1
2
00, 01, 10
4
0x0, 0x1, 0x2, 0x4, 0x8
27.3.4.5.3 Ramp Pattern
The ramp pattern can be used to verify that no data is lost at the trace receiver.
The ramp pattern generator is implemented as a 4-bit up counter.
27.3.4.5.4 Pseudo Random (LFSR) Pattern
The linear feedback shift register (LFSR) pattern can be used to verify the transporting of SDTI data
across the entire software stack without loss of data.
Pseudo random data is obtained from the 16-bit LFSR. The shift register implements the following
polynomial:
G(x) = x
16
+ x
15
+ x
13
+ x
4
+ 1
LFSR is initialized with a 0xFFFF each time pattern generation is enabled.
This LFSR can provide a 64-K long unique data sequence of 16-bit data. For the LFSR pattern, the LSBs
are output (the lower 4 bits are output in the case of a 4-bit interface). The upper bits keep the pattern
unique for 64-K samples.
The first six values of LFSR are:
1. 0xFFFF
2. 0x5FEF
3. 0xBFDE
4. 0xDFAD
5. 0x1F4B
6. 0x3E96
3616
Debug and Emulation
SWPU177N – December 2009 – Revised November 2010
Copyright © 2009–2010, Texas Instruments Incorporated
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