NXP Semiconductors MWCT101 S Series, Reference Manual

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The bytes not assigned to data flash via the FlexNVM partition code are used by the
FTFC to obtain an effective endurance increase for the EEPROM data. The built-in
emulated EEPROM record management system raises the number of program/erase
cycles that can be attained prior to device wear-out by cycling the EEPROM data through
a larger emulated EEPROM NVM storage space.
While different partitions of the FlexNVM are available, the intention is that a single
choice for the FlexNVM partition code and emulated EEPROM data set size is used
throughout the entire lifetime of a given application.
Normal EEE writes and quick writes should not be used in an aggressive brownout
environment (e.g., multiple back-to-back brownouts without recovery in between).
32.5.2.5 ECC implementation for FlexNVM
When the FlexNVM region is configured as Data Flash, any single-bit ECC errors are
automatically corrected, and any double-bit ECC errors are reflected onto
FERSTAT[DFDIF] flag at the read access from Data Flash.
When the FlexNVM region is configured as Emulated EEPROM, any single-bit ECC
errors are automatically corrected before copying data into EEERAM at the read access
from Emulated EEPROM, and any double-bit ECC errors on valid Emulated EEPROM
locations which containing data that need to be copied to EEERAM are reflected as the
corresponding data records left as all 1's in EEERAM.
32.5.3 Interrupts
The FTFC module can generate interrupt requests to the MCU upon the occurrence of
various FTFC events. These interrupt events and their associated status and control bits
are shown in the following table.
Table 32-16. FTFC interrupt sources
FTFC Event Readable
Status Bit
Interrupt
Enable Bit
FTFC Command and CSEc command Complete FSTAT[CCIF] FCNFG[CCIE]
FTFC Read Collision Error FSTAT[RDCOLERR] FCNFG[RDCOLLIE]
FTFC ECC Error Detection FERSTAT[DFDIF] FERCNFG[DFDIE]
Chapter 32 Flash Memory Module (FTFC)
MWCT101xS Series Reference Manual, Rev. 3, 07/2019
NXP Semiconductors 741