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41.5.18.1 Automatic fault clearing
If the automatic fault clearing is selected (FAULTM[1:0] = 1:1), then the channels output
disabled by fault control is again enabled when the fault input signal (FAULTIN) returns
to zero and a new PWM cycle begins. See the following figure.
FTM counter
channel (n) output
(before fault control)
FAULTIN bit
channel (n) output
the beginning of new PWM cycles
FAULTF bit
FAULTF bit is cleared
The channel (n) output is after the fault control with automatic fault clearing and POLn = 0.
NOTE
Figure 41-84. Fault control with automatic fault clearing
41.5.18.2 Manual fault clearing
If the manual fault clearing is selected (FAULTM[1:0] = 0:1 or 1:0), then the channels
output disabled by fault control is again enabled when the FAULTF bit is cleared and a
new PWM cycle begins. See the following figure.
Chapter 41 FlexTimer Module (FTM)
MWCT101xS Series Reference Manual, Rev. 3, 07/2019
NXP Semiconductors
1249
Summary of Contents for MWCT101 S Series
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Page 50: ...Conventions MWCT101xS Series Reference Manual Rev 3 07 2019 50 NXP Semiconductors...
Page 70: ...Aliased bit band regions MWCT101xS Series Reference Manual Rev 3 07 2019 70 NXP Semiconductors...
Page 78: ...Pinout diagrams MWCT101xS Series Reference Manual Rev 3 07 2019 78 NXP Semiconductors...
Page 96: ...WCT101xS safety concept MWCT101xS Series Reference Manual Rev 3 07 2019 96 NXP Semiconductors...
Page 130: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 130 NXP Semiconductors...
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Page 472: ...Application Information MWCT101xS Series Reference Manual Rev 3 07 2019 472 NXP Semiconductors...
Page 528: ...Module clocks MWCT101xS Series Reference Manual Rev 3 07 2019 528 NXP Semiconductors...
Page 634: ...SRAM configuration MWCT101xS Series Reference Manual Rev 3 07 2019 634 NXP Semiconductors...
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Page 992: ...ADC calibration scheme MWCT101xS Series Reference Manual Rev 3 07 2019 992 NXP Semiconductors...
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Page 1726: ...Debug and security MWCT101xS Series Reference Manual Rev 3 07 2019 1726 NXP Semiconductors...
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