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40.3.16 Pulse-Out n Delay register (PDBx_POnDLY)
Note: This register is internally buffered, and any values written to the register are
written to its internal buffer instead; in other words, the internal device bus does not write
directly to this register. The value in this register's internal buffer is loaded into this
register only after "1" is written to the SC[LDOK] bit.
Address: Base a 194h (4d × i), where i=0d to 0d
Bit 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10
9
8
7
6
5
4
3
2
1
0
R
W
Reset
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
PDBx_POnDLY field descriptions
Field
Description
31–16
DLY1
PDB Pulse-Out Delay 1
These bits specify the delay 1 value for the PDB Pulse-Out. Pulse-Out goes high when the PDB counter is
equal to the DLY1. Reading these bits returns the value of internal register that is effective for the current
PDB cycle.
DLY2
PDB Pulse-Out Delay 2
These bits specify the delay 2 value for the PDB Pulse-Out. Pulse-Out goes low when the PDB counter is
equal to the DLY2. Reading these bits returns the value of internal register that is effective for the current
PDB cycle.
40.4 Functional description
40.4.1 PDB pre-trigger and trigger outputs
The PDB contains a counter whose output is compared to several different digital values.
If the PDB is enabled, then a trigger input event will reset the counter and make it start to
count. A trigger input event is defined as a rising edge being detected on a selected
trigger input source, or if a software trigger is selected and the Software Trigger bit
(SC[SWTRIG]) is written with 1. For each channel, a delay m determines the time
between assertion of the trigger input event to the time at which changes in the pre-
trigger m output signal are started. The time is defined as:
Functional description
MWCT101xS Series Reference Manual, Rev. 3, 07/2019
1110
NXP Semiconductors
Summary of Contents for MWCT101 S Series
Page 2: ...MWCT101xS Series Reference Manual Rev 3 07 2019 2 NXP Semiconductors...
Page 42: ...MWCT101xS Series Reference Manual Rev 3 07 2019 42 NXP Semiconductors...
Page 50: ...Conventions MWCT101xS Series Reference Manual Rev 3 07 2019 50 NXP Semiconductors...
Page 70: ...Aliased bit band regions MWCT101xS Series Reference Manual Rev 3 07 2019 70 NXP Semiconductors...
Page 78: ...Pinout diagrams MWCT101xS Series Reference Manual Rev 3 07 2019 78 NXP Semiconductors...
Page 96: ...WCT101xS safety concept MWCT101xS Series Reference Manual Rev 3 07 2019 96 NXP Semiconductors...
Page 130: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 130 NXP Semiconductors...
Page 284: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 284 NXP Semiconductors...
Page 430: ...Functional Description MWCT101xS Series Reference Manual Rev 3 07 2019 430 NXP Semiconductors...
Page 472: ...Application Information MWCT101xS Series Reference Manual Rev 3 07 2019 472 NXP Semiconductors...
Page 528: ...Module clocks MWCT101xS Series Reference Manual Rev 3 07 2019 528 NXP Semiconductors...
Page 634: ...SRAM configuration MWCT101xS Series Reference Manual Rev 3 07 2019 634 NXP Semiconductors...
Page 818: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 818 NXP Semiconductors...
Page 960: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 960 NXP Semiconductors...
Page 992: ...ADC calibration scheme MWCT101xS Series Reference Manual Rev 3 07 2019 992 NXP Semiconductors...
Page 1348: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 1348 NXP Semiconductors...
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Page 1514: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 1514 NXP Semiconductors...
Page 1726: ...Debug and security MWCT101xS Series Reference Manual Rev 3 07 2019 1726 NXP Semiconductors...
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