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20.4.2.1 Optional interrupt notification for non-correctable error
events
The ERM provides an option to generate an interrupt notification upon the report of a
non-correctable ECC event. This sequence describes how to use the option:
1. To enable interrupt notifications for non-correctable error events on Memory n, set
CRx[ENCIEn] to 1.
2. Subsequently, when a non-correctable error event on Memory n is detected, the
ERM:
• Records the event and address as usual.
• Additionally sends an interrupt notification corresponding to the event.
3. To clear both the record of an event and the corresponding interrupt notification,
write 1 to SRx[NCEn] to change its value to 0.
20.5 Initialization
For each ERM channel, prepare the corresponding memory array before enabling ERM
interrupts about errors for that memory.
1. Initialize the memory to a known value so that the correct corresponding ECC
codeword is stored.
2. During the memory's initialization, if the ERM captures information about any ECC
error event, clear the corresponding SRx[SBCn] or SRx[NCEn] field that stores the
record of the event.
3. Program the applicable CRx[ESCIEn] and CRx[ENCIEn] fields to enable ERM
interrupts as desired.
Initialization
MWCT101xS Series Reference Manual, Rev. 3, 07/2019
452
NXP Semiconductors
Summary of Contents for MWCT101 S Series
Page 2: ...MWCT101xS Series Reference Manual Rev 3 07 2019 2 NXP Semiconductors...
Page 42: ...MWCT101xS Series Reference Manual Rev 3 07 2019 42 NXP Semiconductors...
Page 50: ...Conventions MWCT101xS Series Reference Manual Rev 3 07 2019 50 NXP Semiconductors...
Page 70: ...Aliased bit band regions MWCT101xS Series Reference Manual Rev 3 07 2019 70 NXP Semiconductors...
Page 78: ...Pinout diagrams MWCT101xS Series Reference Manual Rev 3 07 2019 78 NXP Semiconductors...
Page 96: ...WCT101xS safety concept MWCT101xS Series Reference Manual Rev 3 07 2019 96 NXP Semiconductors...
Page 130: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 130 NXP Semiconductors...
Page 284: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 284 NXP Semiconductors...
Page 430: ...Functional Description MWCT101xS Series Reference Manual Rev 3 07 2019 430 NXP Semiconductors...
Page 472: ...Application Information MWCT101xS Series Reference Manual Rev 3 07 2019 472 NXP Semiconductors...
Page 528: ...Module clocks MWCT101xS Series Reference Manual Rev 3 07 2019 528 NXP Semiconductors...
Page 634: ...SRAM configuration MWCT101xS Series Reference Manual Rev 3 07 2019 634 NXP Semiconductors...
Page 818: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 818 NXP Semiconductors...
Page 960: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 960 NXP Semiconductors...
Page 992: ...ADC calibration scheme MWCT101xS Series Reference Manual Rev 3 07 2019 992 NXP Semiconductors...
Page 1348: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 1348 NXP Semiconductors...
Page 1366: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 1366 NXP Semiconductors...
Page 1514: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 1514 NXP Semiconductors...
Page 1726: ...Debug and security MWCT101xS Series Reference Manual Rev 3 07 2019 1726 NXP Semiconductors...
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