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• Integral non-linearity (INL): This error is defined as the highest-value or absolute
value that the running sum of DNL achieves. More simply, this is the worst-case
difference of the actual transition voltage to a given code and its corresponding ideal
transition voltage, for all codes.
• Total unadjusted error (TUE): This error is defined as the difference between the
actual transfer function and the ideal straight-line transfer function and includes all
forms of error.
11.6.2.6 Code jitter, non-monotonicity, and missing codes
Analog-to-digital converters are susceptible to three special forms of error:
• Code jitter: Code jitter occurs when a given input voltage converts to one of the two
values when sampled repeatedly. Ideally, when the input voltage is infinitesimally
smaller than the transition voltage, the converter yields the lower code, and vice-
versa. However, even small amounts of system noise can cause the converter to be
indeterminate, between two codes, for a range of input voltages around the transition
voltage.
This error may be reduced by repeatedly sampling the input and averaging the result.
Additionally, the techniques discussed in
• Non-monotonicity: Non-monotonicity occurs when, except for code jitter, the
converter converts to a lower code for a higher input voltage.
• Missing codes: Missing codes are those values never converted for any input value.
In 8-bit or 10-bit mode, the ADC is guaranteed to be monotonic and have no missing
codes.
Application information
K32 L2A Reference Manual, Rev. 2, 01/2020
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NXP Semiconductors
Summary of Contents for K32 L2A Series
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Page 122: ...Flash Memory Clock K32 L2A Reference Manual Rev 2 01 2020 122 NXP Semiconductors...
Page 158: ...Debug and security K32 L2A Reference Manual Rev 2 01 2020 158 NXP Semiconductors...
Page 174: ...Module Signal Description Tables K32 L2A Reference Manual Rev 2 01 2020 174 NXP Semiconductors...
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