NXP Semiconductors K32 L2A Series, Reference Manual, Page: 1238 / 1379

Field Function
—
12-0
R3_0_CT
Runs of Zeroes, Length 3 Count. Reads the final Runs of Zeroes, length 3 count after entropy generation.
Requires TRNG0_MCTL[PRGM] = 0.
48.1.3.3.20 TRNG0 Statistical Check Run Length 3 Limit (TRNG0_SCR3L)
48.1.3.3.20.1 Address
Register Offset Description
TRNG0_SCR3L 400A502Ch Accessible at this address when
TRNG0_MCTL[PRGM] = 1]
48.1.3.3.20.2 Function
The TRNG0 Statistical Check Run Length 3 Limit Register defines the allowable
maximum and minimum number of runs of length 3 detected during entropy generation.
To pass the test, the number of runs of length 3 (for samples of both 0 and 1) must be less
than the programmed maximum value, and the number of runs of length 3 must be
greater than (maximum - range). If this test fails, the Retry Counter in TRNG0_SCMISC
will be decremented, and a retry will occur if the Retry Count has not reached zero. If the
Retry Count has reached zero, an error will be generated. Note that this address (0x2C) is
used as TRNG0_SCRxC3L only if TRNG0_MCTL[PRGM] is 1. If
TRNG0_MCTL[PRGM] is 0, this address is used as TRNG0_SCRxC3C readback
register.
48.1.3.3.20.3 Diagram
Bits 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16
R
Reserved RUN3_RNG
W
Reset
0 0 0 0 0 0 0 0 0 1 0 1 1 0 0 0
Bits 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
R
Reserved RUN3_MAX
W
Reset
0 0 0 0 0 0 0 0 0 1 1 1 1 1 0 1
Standalone True Random Number Generator (SA-TRNG).
K32 L2A Reference Manual, Rev. 2, 01/2020
1238 NXP Semiconductors