NXP Semiconductors K32 L2A Series, Reference Manual, Page: 1231 / 1379

48.1.3.3.14 TRNG0 Statistical Check Monobit Limit (TRNG0_SCML)
48.1.3.3.14.1 Address
Register Offset Description
TRNG0_SCML 400A5020h Accessible at this address when
TRNG0_MCTL[PRGM] = 1]
48.1.3.3.14.2 Function
The TRNG0 Statistical Check Monobit Limit Register defines the allowable maximum
and minimum number of ones/zero detected during entropy generation. To pass the test,
the number of ones/zeroes generated must be less than the programmed maximum value,
and the number of ones/zeroes generated must be greater than (maximum - range). If this
test fails, the Retry Counter in TRNG0_SCMISC will be decremented, and a retry will
occur if the Retry Count has not reached zero. If the Retry Count has reached zero, an
error will be generated. Note that this offset (0x20) is used as TRNG0_SCML only if
TRNG0_MCTL[PRGM] is 1. If TRNG0_MCTL[PRGM] is 0, this offset is used as
TRNG0_SCMC readback register.
48.1.3.3.14.3 Diagram
Bits 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16
R
MONO_RNG
W
Reset
0 0 0 0 0 0 0 1 0 0 0 0 1 1 0 0
Bits
15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
R
MONO_MAX
W
Reset
0 0 0 0 0 1 0 1 0 1 1 0 1 0 0 0
48.1.3.3.14.4 Fields
Field Function
31-16
MONO_RNG
Monobit Range. The number of ones/zeroes detected during entropy generation must be greater than
MONO_MAX - MONO_RNG, else a retry or error will occur. This register is cleared to the default POR
value by writing the TRNG0_MCTL[RST_DEF] bit to 1.
Table continues on the next page...
Chapter 48 SA-TRNG Standalone
K32 L2A Reference Manual, Rev. 2, 01/2020
NXP Semiconductors 1231