NXP Semiconductors MPC5566, Reference Manual

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Enhanced Queued Analog-to-Digital Converter (eQADC)
MPC5566 Microcontroller Reference Manual, Rev. 2
Freescale Semiconductor 19-41
NOTE
Simultaneous write accesses from ADC0 and ADC1 to ADC_TBCR are not
allowed.
19.3.3.4 ADC n Gain Calibration Constant Registers (ADC0_GCCR and
ADC1_GCCR)
The ADC n _GCCR contains the gain calibration constant used to fine-tune the ADC n conversion results.
Refer to Section 19.4.5.4, “ADC Calibration Feature ,” for details about the calibration scheme used in the
eQADC.
Address: 0x0003 Access: R/W
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
R
TBC_VALUE
W
Reset 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
Figure 19-21. ADC Time Base Counter Register (ADC_TBCR)
Table 19-31. ADC_TBCR Field Descriptions
Field Description
0–15
TBC_
VALUE
[0:15]
Time base counter VALUE. Contains the current value of the time base counter. Reading TBC_VALUE returns the
current value of time base counter. Writes to TBC_VALUE register load the written data to the counter. The time base
counter counts from 0x0000 to 0xFFFF and wraps when reaching 0xFFFF.
Address: 0x0004 Access: R/W
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
R 0
GCC0
W
Reset 0 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0
16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31
R 0
GCC1
W
Reset 0 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0
Figure 19-22. ADC n Gain Calibration Constant Registers (ADC n _GCCR)