NXP Semiconductors MPC5566, Reference Manual

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IEEE 1149.1 Test Access Port Controller (JTAGC)
MPC5566 Microcontroller Reference Manual, Rev. 2
Freescale Semiconductor 24-3
24.1.4.2 IEEE 1149.1-2001 Defined Test Modes
The JTAGC supports several IEEE 1149.1-2001 defined test modes. The test mode is selected by loading
the appropriate instruction into the instruction register while the JTAGC is enabled. Supported test
instructions include EXTEST, HIGHZ, CLAMP, SAMPLE and SAMPLE/PRELOAD. Each instruction
defines the set of data registers that can operate and interact with the on-chip system logic while the
instruction is current. Only one test data register path is enabled to shift data between TDI and TDO for
each instruction.
The boundary scan register is enabled for serial access between TDI and TDO when the EXTEST,
SAMPLE or SAMPLE/PRELOAD instructions are active. The single-bit bypass register shift stage is
enabled for serial access between TDI and TDO when the HIGHZ, CLAMP or reserved instructions are
active. The functionality of each test mode is explained in more detail in
Section 24.4.4, “JTAGC
Instructions .”
24.1.4.3 Bypass Mode
When no test operation is required, the BYPASS instruction can be loaded to place the JTAGC into bypass
mode. While in bypass mode, the single-bit bypass shift register is used to provide a minimum-length
serial path to shift data between TDI and TDO.
24.1.4.4 TAP Sharing Mode
There are four selectable auxiliary TAP controllers that share the TAP with the JTAGC. Selectable TAP
controllers include the Nexus port controller (NPC), e200 OnCE, eTPU Nexus, and eDMA Nexus. The
instructions required to grant ownership of the TAP to the auxiliary TAP controllers are
ACCESS_AUX_TAP_NPC, ACCESS_AUX_TAP_ONCE, ACCESS_AUX_TAP_eTPU,
ACCESS_AUX_TAP_DMA. Instruction opcodes for each instruction are shown in
Table 24-3 .
When the access instruction for an auxiliary TAP is loaded, control of the JTAG pins is transferred to the
selected TAP controller. Any data input via TDI and TMS is passed to the selected TAP controller, and any
TDO output from the selected TAP controller is sent back to the JTAGC to be output on the pins. The
JTAGC regains control of the JTAG port during the UPDATE-DR state if the PAUSE-DR state was
entered. Auxiliary TAP controllers are held in RUN-TEST/IDLE while they are inactive.
For more information on the TAP controllers refer to Chapter 25, “Nexus Development Interface .”