IEEE 1149.1 Test Access Port Controller (JTAGC)
MPC5565 Microcontroller Reference Manual, Rev. 1.0
Freescale Semiconductor
23-7
Figure 23-5. IEEE 1149.1-2001 TAP Controller Finite State Machine
Test logic
reset
Run-test/idle
Select-DR-scan
Select-IR-scan
Capture-DR
Capture-IR
Shift-DR
Shift-IR
Exit1-DR
Exit1-IR
Pause-DR
Pause-IR
Exit2-DR
Exit2-IR
Update-DR
Update-IR
1
0
1
1
1
0
0
0
0
1
1
0
0
1
1
1
1
0
0
0
0
1
1
1
1
0
0
1
1
0
0
0
NOTE: The value shown adjacent to each state transition in this figure represents the value of TMS at the time
of a rising edge of TCK.
Summary of Contents for MPC5565
Page 18: ...MPC5565 Microcontroller Reference Manual Devices Supported MPC5565 MPC5565 RM Rev 1 0 09 2007...
Page 34: ...MPC5565 Reference Manual Rev 1 0 Freescale Semiconductor 15...
Page 35: ...MPC5565 Reference Manual Rev 1 0 16 Freescale Semiconductor...
Page 553: ...Flash Memory MPC5565 Microcontroller Reference Manual Rev 1 0 13 38 Freescale Semiconductor...
Page 559: ...SRAM MPC5565 Microcontroller Reference Manual Rev 1 0 14 6 Freescale Semiconductor...
Page 973: ...Preface MPC5565 Microcontroller Reference Manual Rev 1 0 21 36 Freescale Semiconductor...
Page 1153: ...Calibration MPC5565 Microcontroller Reference Manual Rev 1 0 B 8 Freescale Semiconductor...