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SLAU723A – October 2017 – Revised October 2018
Copyright © 2017–2018, Texas Instruments Incorporated
JTAG Interface
Chapter 3
SLAU723A – October 2017 – Revised October 2018
JTAG Interface
The Joint Test Action Group (JTAG) port is an IEEE standard that defines a Test Access Port (TAP) and
Boundary Scan Architecture for digital integrated circuits and provides a standardized serial interface for
controlling the associated test logic. The TAP, Instruction Register (IR), and Data Register (DR) can be
used to test the interconnections of assembled printed-circuit boards and obtain manufacturing information
on the components. The JTAG port also provides a means of accessing and controlling design-for-test
features such as I/O pin observation and control, scan testing, and debugging.
Topic
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Page
3.1
Introduction
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3.2
Block Diagram
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3.3
Functional Description
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3.4
Initialization and Configuration
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3.5
Register Descriptions
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