test environment
Issue 5 October 2002
551
555-233-119
Feature Interactions
■
The long test recycles power in some specified cabinet on non-SPE and
maintenance board carriers and is destructive. Specifically, the “a” carrier
of PPNs does not have power recycled.
■
All port carriers are recycled, and service is interrupted for each port
carrier.
■
If a carrier containing an active tone-clock board is recycled, all ports in the
cabinet or port network will have service disrupted.
Output
The following example shows the output for test environment 1 to test a PPN
cabinet. The responses appear on a test-by-test basis with one line of data for
each test result.
Field descriptions
Port
Port address (cabinet-carrier)
Maintenance
Name
The name of maintenance object
Alt. Name
Not applicable
Test No.
The test being executed.
Result
Test result: Pass, Abort, Fail, Disabled
Error Code
Numeric code explaining why the release failed or aborted. See
the detailed list of the codes by test number for each MO.
test environment 1
TEST RESULTS
Port Maintenance Name Alt. Name Test No. Result Error Code
01 CABINET 122 PASS
01 EMG-XFER 124 PASS
01 EXT-DEV 120 PASS
01 EXT-DEV 120 PASS
01 RING-GEN 117 PASS
01 RING-GEN 118 PASS