test cdr-link
Issue 5 October 2002
541
555-233-119
Action/Object
Qualifier
Qualifier Description
Logins
Defaults
Feature
Interactions
test cdr-link
location
short
long
repeat
number
clear
schedule
Carrier location where memory card
resides: High or Critical Reliability (a
or b)
1
; duplicated (a, A, b, or B)
Option for a brief series of
nondestructive diagnostic tests.
Option for a longer, more
comprehensive test series (includes
a destructive test)
How many times each test in the
sequence is repeated (1-100)
This option causes the test sequence
(short or long) to repeat until the
alarm (if any) is cleared or a single
test in the sequence fails.
2
Use the screen to schedule
execution of the command. The
command is placed in the command
queue and is executed at the
specified time. The information
displayed by the command is sent to
the system printer instead of the
screen.
3
Examples:
test card-mem
test card-mem a l
test card-mem b sh r 2
test card-mem a sch
test card-mem a c
1
Carrier location required on command line
2
If no alarms are registered against the maintenance object then the test sequence is run only once. The long
clear option forces a clear of all alarms if no errors are encountered during testing. The short clear option only
clears alarms pertinent to tests in the short sequence. SEE WARNING BELOW.
3
See the Report Scheduler and System Printer feature specification for more details.
init
inads
craft
Test
sequence
= short