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SPNU503C – March 2018
Copyright © 2018, Texas Instruments Incorporated
Programmable Built-In Self-Test (PBIST) Module
Chapter 7
SPNU503C – March 2018
Programmable Built-In Self-Test (PBIST) Module
This chapter describes the programmable built-in self-test (PBIST) controller module used for testing the
on-chip memories on the Hercules microcontrollers.
Topic
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Page
7.1
Overview
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7.2
RAM Grouping and Algorithm
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7.3
PBIST Flow
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7.4
Memory Test Algorithms on the On-chip ROM
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7.5
PBIST Control Registers
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7.6
PBIST Configuration Example
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