System and Peripheral Control Registers
182
SPNU503C – March 2018
Copyright © 2018, Texas Instruments Incorporated
Architecture
2.5.2.6
EFUSE Controller Control Register (EFC_CTLREG)
This register is shown in
and described in
.
Figure 2-64. EFUSE Controller Control Register (EFC_CTLREG) [offset = ECh]
31
16
Reserved
R-0
15
4
3
0
Reserved
EFC_INSTR_WEN
R-0
R/WP-5h
LEGEND: R/W = Read/Write; R = Read only; WP = Write in privileged mode only; -
n
= value after reset
Table 2-79. EFUSE Controller Control Register (EFC_CTLREG) Field Descriptions
Bit
Field
Value
Description
31-4
Reserved
0
Reads return 0. Writes have no effect.
3-0
EFC_INSTR_WEN
Enable user write of 4 EFUSE controller instructions.
SYS module generates the enable signal which will be tied to
OCP_FROM_WRITE_DISABLE on efuse controller port
Ah
Writing of instructions (Program, ProgramCRA, RunAutoload, and LoadFuseScanchain) to
EFC is allowed enabled.
Others
Writing of instructions (Program, ProgramCRA, RunAutoload, and LoadFuseScanchain) in
EFC registers is blocked.
2.5.2.7
Die Identification Register Lower Word (DIEIDL_REG0)
The DIEIDL_REG0 is a duplicate of DIEIDL, see
. The DIEIDL_REG0, shown in
and described in
, contains information about the die wafer number, and X, Y wafer
coordinates.
Figure 2-65. Die Identification Register, Lower Word (DIEIDL_REG0) [offset = F0h]
31
24
23
16
WAFER #
Y WAFER COORDINATE
R-D
R-D
15
12
11
0
Y WAFER COORDINATE
X WAFER COORDINATE
R-D
R-D
LEGEND: R = Read only; -
n
= value after reset; D = value is device specific
Table 2-80. Die Identification Register, Lower Word (DIEIDL_REG0) Field Descriptions
Bit
Field
Description
31-24
WAFER #
These read-only bits contain the wafer number of the device.
23-12
Y WAFER COORDINATE
These read-only bits contain the Y wafer coordinate of the device.
11-0
X WAFER COORDINATE
These read-only bits contain the X wafer coordinate of the device.
NOTE:
Die Identification Information
The die identification information will vary from unit to unit. This information is programmed
by TI as part of the initial device test procedure.