System and Peripheral Control Registers
150
SPNU503C – March 2018
Copyright © 2018, Texas Instruments Incorporated
Architecture
2.5.1.28 Die Identification Register Lower Word (DIEIDL)
The DIEIDL register, shown in
and described in
, contains information about the die
wafer number, and X, Y wafer coordinates.
Figure 2-33. Die Identification Register, Lower Word (DIEIDL) [offset = 7Ch]
31
24
23
16
WAFER #
Y WAFER COORDINATE
R-D
R-D
15
12
11
0
Y WAFER COORDINATE
X WAFER COORDINATE
R-D
R-D
LEGEND: R = Read only; -
n
= value after reset; D = value is device specific
Table 2-47. Die Identification Register, Lower Word (DIEIDL) Field Descriptions
Bit
Field
Description
31-24
WAFER #
These read-only bits contain the wafer number of the device.
23-12
Y WAFER COORDINATE
These read-only bits contain the Y wafer coordinate of the device.
11-0
X WAFER COORDINATE
These read-only bits contain the X wafer coordinate of the device.
NOTE:
Die Identification Information
The die identification information will vary from unit to unit. This information is programmed
by TI as part of the initial device test procedure.
2.5.1.29 Die Identification Register Upper Word (DIEIDH)
The DIEIDH register, shown in
and described in
, contains information about the
die lot number.
Figure 2-34. Die Identification Register, Upper Word (DIEIDH) [offset = 80h]
31
24
23
16
Reserved
LOT #
R-0
R-D
15
0
LOT #
R-D
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset; D = value is device dependent
Table 2-48. Die Identification Register, Upper Word (DIEIDH) Field Descriptions
Bit
Field
Description
31-24
Reserved
Reserved for TI use. Writes have no effect.
23-0
LOT #
This read-only register contains the device lot number.
NOTE:
Die Identification Information
The die identification information will vary from unit to unit. This information is programmed
by TI as part of the initial device test procedure.