TC1784
Direct Memory Access Controller (DMA)
User´s Manual
11-42
V1.1, 2011-05
DMA, V3.03
1)
11.2.13.3 Pattern Detection for 16-bit Data Width
When 16-bit channel data width is selected (CHCRmn.CHDW = 01
B
) the pattern
detection logic can be configured as shown in
. Three compare match
configurations are possible.
When 16-bit channel data width is selected, the pattern detection logic makes it possible
to compare the complete half-word of one read move only (aligned mode) or to compare
upper and lower byte of two consecutive read moves (unaligned modes). Both modes
can be combined (combined mode) too. A mask operation of each compared bit is
possible.
In unaligned mode 1 (source address decremented), the high byte (RD01) of the current
and the low byte (RD00) of the previous 16-bit read move are compared.
In unaligned mode 2 (source address incremented), the low byte (RD00) of the current
and the high byte (RD01) of the previous 16-bit read move are compared.
If it is not known on which byte boundary (even or odd address) the 16-bit pattern to be
detected is located, the combined mode should be used. This mode is the most flexible
Table 11-5
Pattern Detection for 16-bit Data Width
CHCR
mn
.
PATSEL
ADRCR
mn
.
INCS
Pattern Detection Operating Modes
00
B
–
Pattern detection disabled
01
B
–
Aligned Mode:
Pattern compare of RD0[1:0] to PAT0[1:0], masked by
PAT0[3:2]
10
B
0
Unaligned Mode 1 (Source Address Decrement):
Pattern compare of RD01 to PAT00, masked by PAT02 of
the actual read move
and
Pattern compare of RD00 to PAT01, masked by PAT03
(LXO) of the previous read move of DMA channel mn
1
Unaligned Mode 2 (Source Address Increment):
Pattern compare of RD00 to PAT01, masked by PAT03 of
the actual read move
and
Pattern compare of RD01 to PAT00, masked by PAT02
(LXO) of the previous read move of DMA channel mn
11
B
0 or 1
Combined Mode:
Pattern compare for aligned mode (PATSEL = 01
B
)
or
unaligned modes (PATSEL = 10
B
)
Summary of Contents for TC1784
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