TC1784
Analog to Digital Converter (ADC)
User´s Manual
23-121
V1.1, 2011-05
ADC, V1.3
23.2.22
Broken Wire Detection
To support self-test in safety-critical applications, each ADC kernel provides a broken
wire detection mechanism to check the connection of sensors or other voltage sources
to the analog inputs of the ADC kernels.
This mechanism allows to prepare the capacitor field C
AIN
before starting the sample
phase and the conversion phase. A preparation phase is added to each conversion of
an input channel with
.ENx = 1 (the broken wire detection can be individually
enabled for each input channel CH0 to CH15).
An analog to digital conversion consists of the following phases:
•
Optional preparation phase:
If a channel is enabled for broken wire detection, the capacitor field C
AIN
is connected
to the analog input CHx defined by
.CHP before the sample phase starts.
The preparation phase length is identical to the sample phase length for this
conversion.
If a channel is disabled for broken wire detection, the preparation phase is omitted
(default setting).
•
Sample phase:
During this phase, the capacitor field C
AIN
is connected to one of the analog inputs
CHx via an input multiplexer (see
). The request sources and the
arbiter define which analog input has the highest priority.
•
Conversion phase:
During this phase, the capacitor field C
AIN
is not connected to an analog input and the
analog to digital conversion takes place. At the end of this phase, C
AIN
is loaded to
about V
AREF
/2.
Figure 23-27 Broken Wire Detection
ADC_broken_wire
complete A/D conversion
without broken wire detection
optional
preparation phase
sample phase
conversion phase
sample phase
conversion phase
complete A/D conversion
with broken wire detection
Summary of Contents for TC1784
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