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34.8 Interrupts
The following table summarizes the ADC interrupts.
Table 34-97. Interrupt Summary
Interrupt
Source
Description
ADC_ERR_INT_B
STAT[[ZCI],
STAT[LLMTI],
STAT[HLMTI]
Zero Crossing, low Limit, and high limit interrupt
ADC_CC0_INT_B
STAT[EOSI0]
RDY[RDY[15:0]]
Conversion Complete and Scan Interrupt for any scan type except
converter B scan in non-simultaneous parallel scan mode (see EOSI0)
ADC_CC1_INT_B
STAT[EOSI1]
RDY[RDY[7:4]]
RDY[RDY[15:12]]
Conversion Complete and Scan Interrupt for converter B scan in non-
simultaneous parallel scan mode (see EOSI1)
ADC interrupts fall into three categories:
• Threshold interrupts, which are caused by three different events. All of these
interrupts are optional and enabled through control register CTRL1:
• Zero crossing — occurs if the current result value has a sign change from the
previous result as configured by the ZXCTRL register.
• Low limit exceeded error — occurs when the current result value is less than the
low limit register value. The raw result value is compared to LOLIM[LLMT]
before the offset register value is subtracted.
• High limit exceeded error — is asserted if the current result value is greater than
the high limit register value. The raw result value is compared to HILIM[HLMT]
before the offset register value is subtracted.
• Conversion complete interrupts, which are generated upon completion of any scan
and convert sequence when CTRL1[EOSIE0]=1. Additional bits may need to be set
in the Interrupt Control Module to enable the CPU to receive the interrupt signal.
• Scan interrupts are generated when a sample is converted. This allows processing of
intermediate conversion data during a scan. The interrupt occurs when any sample
has its SCTRL[SC] and SCHLTEN[SCHLTEN] bit enabled (set), and the
RDY[RDY] bit for that sample is asserted. Use these registers to determine which
sample triggered the interrupt.
Interrupts
KV4x Reference Manual, Rev. 2, 02/2015
720
Preliminary
Freescale Semiconductor, Inc.
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