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MPC563XM Reference Manual, Rev. 1
Freescale Semiconductor
1357
Preliminary—Subject to Change Without Notice
Figure 31-6. IEEE 1149.1-2001 TAP Controller Finite State Machine
TEST LOGIC
RESET
RUN-TEST/IDLE
SELECT-DR-SCAN
SELECT-IR-SCAN
CAPTURE-DR
CAPTURE-IR
SHIFT-DR
SHIFT-IR
EXIT1-DR
EXIT1-IR
PAUSE-DR
PAUSE-IR
EXIT2-DR
EXIT2-IR
UPDATE-DR
UPDATE-IR
1
0
1
1
1
0
0
0
0
1
1
0
0
1
1
1
1
0
0
0
0
1
1
1
1
0
0
1
1
0
0
0
NOTE: The value shown adjacent to each state transition in this figure represents the value of TMS at the time
of a rising edge of TCK.