Avaya S8700 Series, Maintenance Manual

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Maintenance-Object Repair Procedures
555-233-143 8-486 Issue 1 May 2002
Notes:
a. Event ID # 2 Test failed—Error counter query for Single bit EDC (bad error
register) on the SDRAM is pegging. If this failure is detected by the test 20
consecutive times the following Warning alarm will be logged:
#1,ACT,DAJ1,A,2,WRN,Single bit EDC test (bad SB err count)
b. Event ID # 3 SDRAM has multiple bit errors—This error can also be
generated inline from the DAJ1 board.
If this failure is detected by the test 1 time, the state of health of the media
server will be lowered to the most critical level and the following Major
alarm will be logged:
#1,ACT,DAJ1,A,3,MAJ,DAJ1 SDRAM multibit errors
c. Event ID # 4 Looparound test failed—The failure could have been a bad
address match, or the bit patterns did not match.
If this failure is detected by the test 3 times, the following Minor alarm will
be logged:
#1,ACT,DAJ1,A,4,MIN,Local Looparound test failure
d. Event ID # 5 Optical Line Receiver experiencing CRC errors—If this failure
is detected by the test 3 times, the following Minor alarm will be logged:
#1,ACT,DAJ1,A,5,MIN,Link Receiver CRC Errors
System Technician-Demanded Tests:
Descriptions and Error Codes
Always investigate tests in the order presented in the following table. By clearing
error codes associated with the
Read Error Register
Test, for example, you may
also clear errors generated from other tests in the testing sequence.
Order of Investigation
Short Test
Sequence Long Test
Sequence
D/ND
1
1. D = Destructive; ND = Nondestructive
Read Error Register Test X X D
DAJ1 Board Local Loop Test X X D