CENTER SCREEN AREA / IMAGE CONTAINERS - …
LSM 710 and LSM 780
Carl Zeiss
FRET View
Systems
238 M60-1-0025
e
02/2010
Thresholds tab (Fig. 268):
The threshold for the image analysis can be set
manually using the slider or editing text box next
to
Donor
,
Acceptor
,
FRET
or
All
, where
All
moves all sliders to the same value. Alternatively,
the threshold can be set from the image when
clicking
From image
provided a background
region and an object region have been defined and
enabled in the FRET tab. The values for the
thresholds are either displayed as grey value levels
(
Raw data
) or
Normalized
to the value 1.
Settings tab (Fig. 264 and Fig. 269):
This tab provides access to the definition of the
parameters used for the image analysis.
The tab
General
(Fig. 264) applies to both
methods, Acceptor Photobleaching and Sensitized
Emission.
If checked the listed options will be taken into
account for the analysis of FRET.
The tab
Sensitized Emission
(Fig. 269) sets
additional Truncation parameters for each method
to analyze the Sensitized Emission experiment such
as the choice for
No truncation
,
Remove
maximum
or the percentage of truncation to
choose between 100, 200 and 300 %.
For the Fc analysis method, the option "
Don’t
show negative values in the Fc image
" can be
selected using the check box. Also included is a
slider to set the value for normalization of the
results of the FRETN-method.
Fig.
268
FRET View Options Control Block,
Thresholds tab
Fig.
269
FRET View Options Control Block,
Settings tab, Sensitized Emission
