Data I/O UniSite-xpi, User Manual

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7. Messages
UniSite-xpi User Manual 7-27
OPERATION FAILED: Structured test vector error (Both Passes). Press F3.
In many cases, vector failures are due to faulty devices. To determine whether this is the cause, try
programming three of the same devices. If only one device out of three has the problem, it usually means
the one device is faulty. If all three fail, then this could be related to a combination of the factors stated
below. It is also possible for a device to fail in the programmer and yet be a fully functional device.
Failures can be caused by some of the following:
- The specific characteristics of the Logic device being tested.
- The manner in which the test vectors have been written.
- The specific design of the Logic device as created by the design engineer.
- The specific defaults used by the programmer’s hardware and firmware in applying the vectors.
To determine exactly which vector/pins are failing, select the Verify option and reverify. Sometimes these
errors can be solved by using a combination of three vector “test” options: 1) High speed logic drivers, 2)
Serial vector test, and 3) Compensated vector test. These options can be enabled one at a time or in any
combination. A hardware option is also available. Refer to Application Note # 983-0372-001.
OPERATION FAILED: Structured test vector error (First pass). Press F3.
In many cases, vector failures are due to faulty devices. To determine whether this is the cause, try
programming three of the same devices. If only one device out of three has the problem, it usually means
the one device is faulty. If all three fail, then this could be related to a combination of the factors stated
below. It is also possible for a device to fail in the programmer and yet be a fully functional device.
Failures can be caused by some of the following:
- The specific characteristics of the Logic device being tested.
- The manner in which the test vectors have been written.
- The specific design of the Logic device as created by the design engineer.
- The specific defaults used by the programmer’s hardware and firmware in applying the vectors.
To determine exactly which vector/pins are failing, select the Verify option and reverify. Sometimes these
errors can be solved by using a combination of three vector “test” options: 1) High speed logic drivers, 2)
Serial vector test, and 3) Compensated vector test. These options can be enabled one at a time or in any
combination. A hardware option is also available. Refer to Application Note # 983-0372-001.
OPERATION FAILED: Structured test vector error (Second pass). Press F3.
In many cases, vector failures are due to faulty devices. To determine whether this is the cause, try
programming three of the same devices. If only one device out of three has the problem, it usually means
the one device is faulty. If all three fail, then this could be related to a combination of the factors stated
below. It is also possible for a device to fail in the programmer and yet be a fully functional device.
Failures can be caused by some of the following:
- The specific characteristics of the Logic device being tested.
- The manner in which the test vectors have been written.
- The specific design of the Logic device as created by the design engineer.
- The specific defaults used by the programmer’s hardware and firmware in applying the vectors.
To determine exactly which vector/pins are failing, select the Verify option and reverify. Sometimes these
errors can be solved by using a combination of three vector “test” options: 1) High speed logic drivers, 2)
Serial vector test, and 3) Compensated vector test. These options can be enabled one at a time or in any
combination. A hardware option is also available. Refer to Application Note # 983-0372-001.
OPERATION FAILED: Verify data error.
This message appears when the programmer has performed a Verify and has found a memory cell that
did not program correctly.