![background image](http://html1.mh-extra.com/html/omron/f250-ume/f250-ume_software-manual_743525052.webp)
1-(44)
Basic Operations
Section 1-6
SeeAlso
See page 1-(53).
HELP
Defect Inspection Methods
An image showing the difference between the model image and inspection
image will be converted internally to a binary image. The method for inspect-
ing defects from those binary images is selected here.
• Labeling*
One group of white pixels is detected as one label and one label that
matches the set conditions will be evaluated to determine if it is a defect
or not.
The asterisk (*) indicates the default setting.
• Binary
The total area of the white pixels is evaluated to determine if there are
defects or not.
Dilated Model
Example: Dilation by 3
pixels when the boundary
level is set to 3.
Eroded Model
Example: Erosion by 3
pixels when the boundary
level is set to 3.
One defect (max. area)
One defect
One defect
Total area of white pixels
Содержание F250-UME
Страница 2: ...80 SSOLFDWLRQ 6RIWZDUH 2SHUDWLRQ 0DQXDO 5HYLVHG HFHPEHU...
Страница 3: ...iii...
Страница 337: ...2 15 4 EC Defect Section 2 15 4 Press the ENT Key The settings will be registered and the screen in 1 will return...
Страница 531: ...2 23 4 ECM Search Section 2 23 4 Press the ENT Key The settings will be registered and the screen in 1 will return...
Страница 748: ...2 49 5 Display Line Display Box Display Circle and Display Cursor Section 2 49...
Страница 798: ...4 44 Memory Card Operations Section 4 6...
Страница 998: ...7 18 Menu Hierarchy Section 7 6...