6
SPNU563A – March 2018
Copyright © 2018, Texas Instruments Incorporated
Contents
7.10.30
Upper Word of Reset Configuration Read Register (RCR_VALUE1)
..................................
7.10.31
FSM Register Write Enable Register (FSM_WR_ENA)
..................................................
7.10.32
EEPROM Emulation Configuration Register (EEPROM_CONFIG)
....................................
7.10.33
FSM Sector Register 1 (FSM_SECTOR1)
.................................................................
7.10.34
FSM Sector Register 2 (FSM_SECTOR2)
.................................................................
7.10.35
Flash Bank Configuration Register (FCFG_BANK)
.......................................................
7.11
POM Control Registers
..................................................................................................
7.11.1
POM Global Control Register (POMGLBCTRL)
............................................................
7.11.2
POM Revision ID Register (POMREV)
......................................................................
7.11.3
POM Flag Register (POMFLG)
...............................................................................
7.11.4
POM Region Start Address Register (POMPROGSTARTx)
..............................................
7.11.5
POM Overlay Region Start Address Register (POMOVLSTARTx)
......................................
7.11.6
POM Region Size Register (POMREGSIZEx)
..............................................................
8
Level 2 RAM (L2RAMW) Module
.........................................................................................
8.1
Overview
...................................................................................................................
8.2
Module Operation
.........................................................................................................
8.2.1
RAM Memory Map
...............................................................................................
8.2.2
Safety Features
..................................................................................................
8.2.3
L2RAMW Auto-Initialization
....................................................................................
8.2.4
Trace Module Support
..........................................................................................
8.2.5
Emulation/Debug Mode Behavior
..............................................................................
8.2.6
Diagnostic Test Procedure
.....................................................................................
8.3
Control and Status Registers
............................................................................................
8.3.1
L2RAMW Module Control Register (RAMCTRL)
............................................................
8.3.2
L2RAMW Error Status Register (RAMERRSTATUS)
.......................................................
8.3.3
L2RAMW Diagnostic Data Vector High Register (DIAG_DATA_VECTOR_H)
..........................
8.3.4
L2RAMW Diagnostic Data Vector Low Register (DIAG_DATA_VECTOR_L)
...........................
8.3.5
L2RAMW Diagnostic ECC Vector Register (DIAG_ECC)
..................................................
8.3.6
L2RAMW RAM Test Mode Control Register (RAMTEST)
.................................................
8.3.7
L2RAMW RAM Address Decode Vector Test Register (RAMADDRDEC_VECT)
......................
8.3.8
L2RAMW Memory Initialization Domain Register (MEMINIT_DOMAIN)
.................................
8.3.9
L2RAMW Bank to Domain Mapping Register0 (BANK_DOMAIN_MAP0)
...............................
8.3.10
L2RAMW Bank to Domain Mapping Register1 (BANK_DOMAIN_MAP1)
..............................
9
Programmable Built-In Self-Test (PBIST) Module
..................................................................
9.1
Overview
...................................................................................................................
9.1.1
Features of PBIST
...............................................................................................
9.1.2
PBIST vs. Application Software-Based Testing
..............................................................
9.1.3
PBIST Block Diagram
...........................................................................................
9.2
RAM Grouping and Algorithm
...........................................................................................
9.3
PBIST Flow
................................................................................................................
9.3.1
PBIST Sequence
.................................................................................................
9.4
Memory Test Algorithms on the On-chip ROM
......................................................................
9.5
PBIST Control Registers
................................................................................................
9.5.1
RAM Configuration Register (RAMT)
.........................................................................
9.5.2
Datalogger Register (DLR)
.....................................................................................
9.5.3
PBIST Activate/Clock Enable Register (PACT)
..............................................................
9.5.4
PBIST ID Register
...............................................................................................
9.5.5
Override Register (OVER)
......................................................................................
9.5.6
Fail Status Fail Register (FSRF0)
.............................................................................
9.5.7
Fail Status Count Registers (FSRC0 and FSRC1)
..........................................................
9.5.8
Fail Status Address Registers (FSRA0 and FSRA1)
.......................................................
9.5.9
Fail Status Data Registers (FSRDL0 and FSRDL1)
........................................................
9.5.10
ROM Mask Register (ROM)
...................................................................................