Memory Test Algorithms on the On-chip ROM
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SPNU563A – March 2018
Copyright © 2018, Texas Instruments Incorporated
Programmable Built-In Self-Test (PBIST) Module
9.4
Memory Test Algorithms on the On-chip ROM
This section provides a brief description for some of the test algorithms used for memory self-test.
1.
March13N:
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March13N is the baseline test algorithm for SRAM testing. It provides the highest overall coverage.
The other algorithms provide additional coverage of otherwise missed boundary conditions of the
SRAM operation.
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The concept behind the general march algorithm is to indicate:
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The bit cell can be written and read as both a 1 and a 0.
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The bits around the bit cell do not affect the bit cell.
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The basic operation of the march is to initialize the array to a know pattern, then march a different
pattern through the memory.
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Type of faults detected by this algorithm:
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Address decoder faults
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Stuck-At faults
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Coupled faults
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State coupling faults
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Parametric faults
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Write recovery faults
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Read/write logic faults