FlexRay Module Registers
1331
SPNU563A – March 2018
Copyright © 2018, Texas Instruments Incorporated
FlexRay Module
26.3.2.1.3 ECC Test Register (ECCTEST)
The ECC Test Register can be used in diagnostic mode to read or write ECC information of message
RAM, transient buffer RAM, input buffer RAM and output buffer RAM locations. Write access to this
register is only possible when in diagnostic mode.
In order to be able to directly access the above mentioned RAM portions, RAM test mode must be
selected in test register 1 and the corresponding RAM section must be selected in test register 2. When
reading a certain RAM location, the corresponding ECC value is shown in RDECC bitfield. Writing to a
certain ECC location copies the contents of WRECC bitfield to the corresponding ECC location.
and
illustrate this register.
NOTE:
For FTU RAM, a separate portion of memory-mapped RAM is available in TCR ECC test
mode, which can be accessed directly for reading or writing ECC information. See
for more details.
Figure 26-111. ECC Test Register (ECCTEST) [offset_CC = 08h]
31
23
22
16
Reserved
RDECC
R-0
R/W-0
15
7
6
0
Reserved
WRECC
R-0
R/W-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 26-91. ECC Test Register (ECCTEST) Field Descriptions
Bit
Field
Value
Description
31-23
Reserved
0
Reads return 0. Writes have no effect.
22-16
RDECC
0-7Fh
Holds ECC bits when reading a RAM location.
15-7
Reserved
0
Reads return 0. Writes have no effect.
6-0
WRECC
0-7Fh
ECC bits to be written in ECC location when writing to a RAM location.