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SPNU563A – March 2018
Copyright © 2018, Texas Instruments Incorporated
Programmable Built-In Self-Test (PBIST) Module
Chapter 9
SPNU563A – March 2018
Programmable Built-In Self-Test (PBIST) Module
This chapter describes the programmable built-in self-test (PBIST) controller module used for testing the
on-chip memories.
Topic
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Page
9.1
Overview
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9.2
RAM Grouping and Algorithm
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9.3
PBIST Flow
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9.4
Memory Test Algorithms on the On-chip ROM
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9.5
PBIST Control Registers
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9.6
PBIST Configuration Example
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