1xEV-DO Measurements
R&S
®
CMW-KG8xx/-KM8xx/-KS8xx
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User Manual 1173.9511.02 ─ 11
Fig. 3-11: 1xEV-DO multi evaluation: magnitude error
The diagrams show the respective measurement error as a function of time. The dia-
grams cover a time interval of 833.33 μs (one half-slot) and contain 1 sample per chip.
If the limits are set, they are indicated by the red dashed lines.
The description of statistical measurement results is covered in
Evaluation Detailed Views: TX Measurement (Scalar) and Power"
For additional information refer to
3.2.8.3
Multi Evaluation Detailed Views: Code Domain
The code domain view presents the CDP and the CDE results displayed in a "Diagram
View" as bar graphs and in a "Table View" as scalar values. Separate values are avail-
able for the I-branch and the Q-branch of the signal. If the limits are set, they are indi-
cated by the red dashed lines.
General Description
深圳德标仪器
135-1095-0799