LSM 880
Left Tool Area and Hardware Control Tools
ZEISS
10/2014 V_01
000000-2071-464
325
5.4.13
Processing – Stitch
Licensing
Instrument
standard
optional
LSM
ELYRA
Lightsheet Z.1
Tool accepts image data recorded data recorded with the acquisition tool
Tile Scan
(incl. combinations with other multi-dimensional acquisition tools). Images recorded
in SIM mode on ELYRA (SIM data) must be processed with the tool
Structured
Illumination
before stitching. For optimal results, image data should have some
degree of lateral overlap. See full description of tool for details.
With this function tiled images acquired with
Versions of ZEN 2012 and upwards and the tiling
function can be stitched together in 2D and 3D.
Select a tiled image (or stack) with the
Select
button (Fig. 430).
The
Correlation Threshold
is defining the
accuracy with which the algorithm detects
similarities in the adjacent image planes.
If a 3D tile scan image has been acquired (Tile Scan
combined with Z-Stack) then additional functions
for the stitching procedure are available.
Ignore z-shift
will in some cases reveal better
results for the 3D stitch. Depending on the image
data the last step of the stitch algorithm, which
makes a correction of the Z-Stacks in Z looking at
the overall image, can lead to unwanted shifts of
the stacks in Z. This can be avoided when this
option is checked.
Fig. 430
Processing – Stitch, Method
Parameters tool
Summary of Contents for LSM 880
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