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UM10503
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© NXP B.V. 2015. All rights reserved.
User manual
Rev. 2.1 — 10 December 2015
1372 of 1441
NXP Semiconductors
UM10503
Chapter 51: LPC43xx/LPC43Sxx JTAG, Serial Wire Debug (SWD), and
51.4 General description
Debug and trace functions are integrated into the ARM Cortex-M4. Serial wire debug and
trace functions are supported in addition to a standard JTAG debug and parallel trace
functions. The ARM Cortex-M4 is configured to support up to eight breakpoints and four
watchpoints.
Debugging with the LPC43xx defaults to JTAG. Once in the JTAG debug mode, the debug
tool can switch to Serial Wire Debug mode.
Remark:
The SWD mode is supported for the ARM Cortex-M4 only.
51.4.1 Embedded Trace Macrocell (ETM)
Trace can be performed using either a 4-bit parallel interface or the Serial Wire Output.
The ETM Trace port provides CPU instruction trace capability using the ETB memory. To
access the ETB memory, enable the ETB SRAM in the CREG block (see
Remark:
The ETM time stamping feature is not implemented.
51.5 Pin description
indicate the various pin functions related to debug and trace.
Some of these functions share pins with other functions which therefore may not be used
at the same time. Use of the JTAG port excludes use of Serial Wire Debug and Serial
Wire Output. Use of the parallel trace requires five pins that may be part of the user
application, limiting debug possibilities for those features. Trace using the Serial Wire
Output does not have this limitation but the bandwidth is limited.
Table 1171.JTAG pin description
Pin Name
Type
Description
TCK
Input
JTAG Test Clock.
This pin is the clock for debug logic when in the
JTAG debug mode.
TMS
Input
JTAG Test Mode Select.
The TMS pin selects the next state in the
TAP state machine.
TDI
Input
JTAG Test Data In.
This is the serial data input for the shift register.
TDO
Output
JTAG Test Data Output.
This is the serial data output from the shift
register. Data is shifted out of the device on the negative edge of the
TCK signal.
TRST
Input
JTAG Test Reset.
The TRST pin can be used to reset the test logic
within the debug logic.