Flash Registers
520
SPRUH22I – April 2012 – Revised November 2019
Copyright © 2012–2019, Texas Instruments Incorporated
Internal Memory
5.4.2.6
Error Status Clear Register (ERR_STATUS_CLR)
Figure 5-97. Error Status Clear Register (ERR_STATUS_CLR)
31
16
Reserved
R-0
15
3
2
1
0
Reserved
UNC_ERR_CL
R
FAIL_1_CLR
FAIL_0_CLR
R-0
R/W0-1
R/W0-1
R/W0-1
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 5-101. Error Status Clear Register (ERR_STATUS_CLR) Field Descriptions
Bit
Field
Value
Description
31-3
Reserved
Reserved
2
UNC_ERR_CLR
Uncorrectable error clear. Writing a 1 to this bit will clear the UNC_ERR bit of ERR_STATUS
register.
1
FAIL_1_CLR
Fail on 1 clear. Writing a 1 to this bit will clear the FAIL_1 bit of ERR_STATUS register. Writes of 0
have no effect.
0
FAIL_0_CLR
Fail on 0 clear. Writing a 1 to this bit will clear the FAIL_0 bit of ERR_STATUS register. Writes of 0
have no effect.
5.4.2.7
Error Counter Register (ERR_CNT)
Figure 5-98. Error Counter Register (ERR_CNT)
31
16 15
0
Reserved
ERR_CNT
R-0
R/W-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 5-102. Error Counter Register (ERR_CNT) Field Descriptions
Bit
Field
Value
Description
31-16
Reserved
Reserved
15-0
ERR_CNT
Single bit error count. This counter increments with every single bit ECC error occurrence. Upon
reaching the threshold value counter stops counting on single bit errors. ERR_CNT can be cleared
(irrespective of whether threshold is met or not) using "Single Err Int Clear" bit. This is applicable for
ECC logic test mode and normal operational mode. In ECC logic test mode, ERR_CNT will keep
incrementing for every cycle after a single bit error occurrence. So, in order to clear ERR_CNT in
ECC logic test mode, ECC logic test mode has to be disabled prior to clearing the ERR_CNT using
"Single Err Int Clear" bit.