Flash Registers
535
SPRUH22I – April 2012 – Revised November 2019
Copyright © 2012–2019, Texas Instruments Incorporated
Internal Memory
Table 5-139. Test Data Out Low Register (FECC_FOUTL_TEST) Field Descriptions
Bit
Field
Value
Description
31-0
DATAOUTL
Low double word test data out. Holds bits 31:0 of the data out of the selected ECC block.
5.4.4.18 ECC Status Register (FECC_STATUS)
Figure 5-136. ECC Status Register (FECC_STATUS)
31
16
Reserved
R-0
15
11
10
8
7
2
1
0
Reserved
CHK_ERR_POS
DATA_ERR_POS
UNC_ERR
SINGLE_ERR
R-0
R-0
R-0
R-0
R-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 5-140. ECC Status Register (FECC_STATUS) Field Descriptions
Bit
Field
Value
Description
31-11
Reserved
Reserved
10-8
CHK_ERR_POS
Test mode ECC bit error position. Holds the bit position in the 8 check bits where the
error occurred.
7-2
DATA_ERR_POS
Test mode data bit error position. Holds the bit position in the 64 bit data where the
error occurred.
1
UNC_ERR
Test mode ECC double bit error. When 1 indicates that the ECC test resulted in an
uncorrectable bit error.
0
SINGLE_ERR
Test mode ECC single bit error. When 1 indicates that the ECC test resulted in a single
bit error.