Flash Registers
576
SPRUHE8E – October 2012 – Revised November 2019
Copyright © 2012–2019, Texas Instruments Incorporated
Internal Memory
Table 5-143. ECC Test Register (FECC_TEST) Field Descriptions
Bit
Field
Value
Description
31-8
Reserved
0
Reserved
7-0
ECC
8-bit ECC for selected 64-bit data. User-configurable ECC bits of the selected 64-bit
data block in ECC test mode.
5.4.4.15 ECC Control Register (FECC_CTRL)
Figure 5-136. ECC Control Register (FECC_CTRL)
31
16
Reserved
R-0
15
2
1
0
Reserved
ECC_SELECT
ECC_TEST_E
N
R-0
R/W-0
R/W-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 5-144. ECC Control Register (FECC_CTRL) Field Descriptions
Bit
Field
Value
Description
31-2
Reserved
0
Reserved
1
ECC_SELECT
ECC block select.
0
Selects the ECC block on bits [63:0] of bank data.
1
Selects the ECC block on bits [127:64] of bank data.
0
ECC_TEST_EN
ECC test mode enable.
0
ECC test mode disabled
1
ECC test mode enabled
5.4.4.16 Test Data Out High Register (FECC_FOUTH_TEST)
Figure 5-137. Test Data Out High Register (FECC_FOUTH_TEST)
31
0
DATAOUTH
R-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 5-145. Test Data Out High Register (FECC_FOUTH_TEST) Field Descriptions
Bit
Field
Value
Description
31-0
DATAOUTH
High double word test data out. Holds bits 63:32 of the data out of the selected ECC block.
5.4.4.17 Test Data Out Low Register (FECC_FOUTL_TEST)
Figure 5-138. Test Data Out Low Register (FECC_FOUTL_TEST)
31
0
DATAOUTL
R-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset