
Self-Diagnostics Test
B-2
72A-1898 Rev. A 11/01
Monday
, November 26, 2001 1:09 pm
Local Self Test
This test only runs if the Global Self-Test detects a
failure. It localizes the failure by sourcing test
signals to the sensing cards. Isolation of the sensing
cards is achieved by breaking the circuit just as the
signal enters the backplane card. The backplane
cards are responsible for providing the interface
between the system processor and the front panel
modules.
The combination of these two tests allow the controller software to
isolate functional failures to the circuit board/module level. The
Self-Diagnostics test simulates a circuit breaker test without activating the
Trip or Close output signals. During this test, hardware circuitry provides
test signals that are tailored to functionally test each type of input
channel associated with the TDR9000 system. Channels of the same type
are provided with identical signals.
N
OTE
The Trip/Close Current board is physically located in the Trip/Close
module; however, its functionality is implemented through the System
module of the Physical Front panel. For the Trip/Close Current module,
if the Self-Diagnostic fails only during the Global phase, it reports the
failure as being related to the System module and reports the internal
circuit board responsible for this module’s operation.
Содержание TDR9000
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