Ceyear 4051 Series, User Manual

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8. Specifications and test methods
8.5 Performance characteristics test
688
25) Set the frequency of synthesized signal generator#1 as 15GHz, the power as+5 dBm and the RF output as
on.
26) Set the frequency of synthesized signal generator#2 as 15.00005GHz, the signal power as -110 dBm and
the RF output as off.
27) Set the power meter frequency as 5GHz.
28) Reset the 4051 analyzer and set the center frequency as 5GHz.
29) Repeat step 6 ~ 13.
TOI distortion (18GHz ~ 50GHz)
30) Set the frequency of synthesized signal generator#1 as 35GHz, the power as+5 dBm and the RF output as
on.
31) Set the frequency of synthesized signal generator#2 as 35.00005GHz, the signal power as -110 dBm and
the RF output as off.
32) Set the power meter frequency as 35GHz.
33) Reset the 4051 analyzer and set the center frequency as 35GHz.
34) Repeat step 6 ~ 13.
TOI distortion (50GHz
～
67GHz)
35) Set the frequency of synthesized signal generator#1 as 55GHz, the power as+5 dBm and the RF output as
on.
36) Set the frequency of synthesized signal generator#2 as 55.00005GHz, the signal power as -110 dBm and
the RF output as off.
37) Set the power meter frequency as 55GHz.
38) Reset the 4051 analyzer and set the center frequency as 55GHz.
39) Repeat step 6 ~ 13.
d) Test records and data processing
40) Select the maximum value in the lower and upper TOI distortion products of the same frequency as the
TOI distortion product ΔA of the mixer level at L (0 ~ L0(-10 dBm). Calculate the TOI intercept point
according to the formula (25) and record the result in the 4051 Record Sheet if it meets relevant
requirement. Otherwise, the result will be considered as noncompliant.
8.5.1.3.7 Phase noise
a) Test items
The phase noise is used to reflect the short-term stability of LO signal frequency of the signal/spectrum
analyzer.
The reference sine signal of 1 GHz and 0 dBm can be measured at 100 Hz, 1 kHz, 10 kHz and 100 kHz offset
carrier. The noise level at each frequency offset of the reference sine signal should be at least 6 dB higher than
that of the signal/spectrum analyzer. If there is spurious response at set frequency offset during test, such
spurious response should be eliminated and measurement should be made near relevant frequency offset.
b) Test equipment
E8257D is recommended for the synthesized signal generator.
c) Test steps