(
)
85
30
Temp
ADC(raw) CAL _ ADC _12T30
30
CAL _ ADC _12T85
CAL _ ADC _12T30
æ
ö
-
=
-
´
+
ç
÷
-
è
ø
(
)
85 30
Temp
ADC(raw) CAL _ ADC _145T30
30
CAL _ ADC _145T85 CAL _ ADC _145T30
æ
ö
-
=
-
´
+
ç
÷
-
è
ø
(
)
85 30
Temp
ADC(raw) CAL _ ADC _ 25T30
30
CAL _ ADC _ 25T85 CAL _ ADC _ 25T30
æ
ö
-
=
-
´
+
ç
÷
-
è
ø
Device Descriptor Table
336
SLAU356I – March 2015 – Revised June 2019
Copyright © 2015–2019, Texas Instruments Incorporated
System Controller A (SYSCTL_A)
(4)
5.9.3.3
Flash Information
lists the flash information descriptor. This descriptor contains information on the maximum
number of pulses required for successful flash program or erase operation.
Table 5-8. Flash Information Descriptor
Flash Info
Tag
00000004h
Length
00000002h
Word
Maximum programming pulses
Word
Maximum erase pulses
5.9.3.4
Random Number Seed
lists the random number seed.
Table 5-9. Random Number Seed
Random Number
Tag
0000000Dh
Length
00000004h
4 words
128-bit random number seed
The random number stored as a seed for a deterministic random number generator is programmed during
test of the device. It is generated on the test system using a cryptographic random number generator.
5.9.3.5
BSL Configuration
lists the BSL configuration data. The BSL configuration stores the communication interface
selection and corresponding communication interface settings.
Table 5-10. BSL Configuration Data
BSL Configuration
Tag
0000000Fh
Length
00000004h
Word
Peripheral interface selection
Word
Port interface configuration for UART
Word
Port interface configuration for SPI
Word
Port interface configuration for I
2
C