(
)
85
30
Temp
ADC(raw) CAL _ ADC _12T30
30
CAL _ ADC _12T85
CAL _ ADC _12T30
æ
ö
-
=
-
´
+
ç
÷
-
è
ø
(
)
85 30
Temp
ADC(raw) CAL _ ADC _145T30
30
CAL _ ADC _145T85 CAL _ ADC _145T30
æ
ö
-
=
-
´
+
ç
÷
-
è
ø
(
)
85 30
Temp
ADC(raw) CAL _ ADC _ 25T30
30
CAL _ ADC _ 25T85 CAL _ ADC _ 25T30
æ
ö
-
=
-
´
+
ç
÷
-
è
ø
Device Descriptor Table
293
SLAU356I – March 2015 – Revised June 2019
Copyright © 2015–2019, Texas Instruments Incorporated
System Controller (SYSCTL)
(2)
4.9.3.3
Flash Information
lists the flash information descriptor. This descriptor contains information on the maximum
number of pulses required for successful flash program or erase operation.
Table 4-7. Flash Information Descriptor
Flash Info
Tag
00000004h
Length
00000002h
Word
Maximum Programming Pulses
Word
Maximum Erase Pulses
4.9.3.4
Random Number Seed
lists the random number seed.
Table 4-8. Random Number Seed
Random Number
Tag
0000000Dh
Length
00000004h
4 words
128-bit random number seed
The random number stored as a seed for a deterministic random number generator is programmed during
test of the device. It is generated on the test system using a cryptographic random number generator.
4.9.3.5
BSL Configuration
lists the BSL configuration data. The BSL configuration stores the communication interface
selection and corresponding communication interface settings.
Table 4-9. BSL Configuration Data
BSL Configuration
Tag
0000000Fh
Length
00000004h
Word
Peripheral Interface Selection
Word
Port Interface Configuration for UART
Word
Port Interface Configuration for SPI
Word
Port Interface Configuration for I
2
C