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11100B–ATARM–31-Jul-12
SAM4S Series [Preliminary]
12. Debug and Test Features
12.1
Description
The SAM4 Series Microcontrollers feature a number of complementary debug and test
capabilities. The Serial Wire/JTAG Debug Port (SWJ-DP) combining a Serial Wire Debug Port
(SW-DP) and JTAG Debug (JTAG-DP) port is used for standard debugging functions, such as
downloading code and single-stepping through programs. It also embeds a serial wire trace.
12.2
Embedded Characteristics
• Debug access to all memory and registers in the system, including Cortex-M4 register bank
when the core is running, halted, or held in reset.
• Serial Wire Debug Port (SW-DP) and Serial Wire JTAG Debug Port (SWJ-DP) debug access
• Flash Patch and Breakpoint (FPB) unit for implementing breakpoints and code patches
• Data Watchpoint and Trace (DWT) unit for implementing watchpoints, data tracing, and
system profiling
• Instrumentation Trace Macrocell (ITM) for support of printf style debugging
• IEEE1149.1 JTAG Boundary-can on All Digital Pins
Figure 12-1. Debug and Test Block Diagram
TST
TMS
TCK/SWCLK
TDI
JTAGSEL
TDO/TRACESWO
Boundary
TAP
SWJ-DP
Reset
and
Test
POR
Summary of Contents for SAM4S Series
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